160 Multipurpose Test Structures and Process Characterization using 0.13µm CMOS: The CHAMP ASIC

Original Uploaded File: Download CHAMP_Paper_TIPP2011_20110914.pdf

Description: TIPP 2011 Proceeding

Matt Andrew
Michael Cooney
Jean-François Genat
Hervé Grabas
Kurtis Nishimura
Eric Oberla
Larry Ruckman
Gary Varner

Electronics

Conference Proceedings

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