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226 Measuring the roughness of buried interfaces by sputter depth profiling

Original Uploaded File: Download qing_ZnO-MgO_interfaces-Sergey-Nanotech_2012.pdf

Description:

Authors:
Jeffrey W. Elam
Qing Peng
Igor V. Veryovkin
Alexander V. Zinovev

Groups:
Characterization
Micro-Channel Plate

Categories:
Published Papers

Uploaded By: PSEC author

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